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Material characterisation equipment accessible to our group from either of the two cleanrooms includes Scanning electron microscopes, Atomic force microscopes, Surface profilometers, Thin film stress analyser, Spectroscopic ellipsometer, X-ray Diffraction measurement (XRD), Transmission electron microscope, and Secondary ion mass spectroscope (SIMS).

Available characterization tools include:
  • Scanning electron microscope
  • Atomic force microscopy
  • Scanning Tunnelling Microscopy
  • Surface profilometry
  • Thin film stress analysis
  • X-ray photoelectron spectroscopy
  • Spectroscopic ellipsometry
  • X-ray Diffraction
  • Transmission electron microscope
  • Secondary ion mass spectroscopy
  • Auger Electron spectroscopy
  • Ion Scattering spectroscopy
  • Near-field scanning optical microscopy
  • and many more ...